Method and apparatus for mass analysing a sample

US12339261B2 · kind B2 · utility

Assignee

• TOFWERK AG · CH

Inventors

• Sonja Klee · Wuppertal, DE
• Steffen Bräkling · Thun, CH
• Marc Gonin · Bern, CH
• Urs Rohner · Thun, CH
• Carsten Stoermer · Bremen, DE

Key dates

• Filing date: Apr 20, 2022
• Grant date: Jun 24, 2025
• Expiry date: Jan 7, 2044

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N30/7253
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a method for mass analysing a sample by ionising the sample to first sample ions and to second sample ions and by obtaining mass spectra from the first sample ions and the second sample ions with a mass analyser (5). Thereby, repeatedly, a first assay is obtained from the sample and transferred past any chromatography column to a first ion source (2) and ionised by the first ion source (2) to the first sample ions, wherein the first sample ions obtained from the respective first assay are transferred to the mass analyser (5), wherein at least one first mass spectrum is obtained with the mass analyser (5) from the first sample ions obtained from the respective first assay and ionised by and transferred from the first ion source (2). Furthermore, at least once, a second assay is obtained from the sample within a time window being associated with the respective second assay and having a window width, wherein the respective second assay is transferred for chromatographic separation via a chromatography column (3) to at least one second ion source (4.1, 4.2) in that after being chromatographically separated, the respective second assay eluting from the chromatog…