Methods and systems for identifying and correcting anomalies in a data environment
US12339817B2 · kind B2 · utility
0Cited by
6References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 30, 2022 |
| Grant date | Jun 24, 2025 |
| Priority date | — |
| Expiry date | Aug 30, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/2462
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computing device may be configured to continuously, repeatedly, or recursively generate, train, improve, focus, or refine the machine learning classifier models that are used data anomalies. The computing device may create a corpus of data based on architecture or standards documents, generate classifier models based on the corpus of data, collect information from one or more data sources, generate feature vectors based on the collected information, apply the feature vectors to the classifier models to generate an analysis result, and identify a data anomaly based on the generated analysis result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.