Centralized analytics of multiple visual inspection appliances
US12340493B2 · kind B2 · utility
0Cited by
2References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2019 |
| Grant date | Jun 24, 2025 |
| Priority date | — |
| Expiry date | May 11, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A visual inspection data collection and analysis system comprising: a plurality of visual inspection appliances (VTA) configured to inspect and acquire visual inspection data relating to inspected items; and a data collection and analytics server (DCAS) configured to receive information comprising the visual inspection data from the multiple VIAs and to analyze the received information to form a big data analysis. The VIAs are adapted for detecting defects or gating or counting the inspected items without the involvement of the DCAS.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.