Patent · US Active

Ruthenium-based sputtering target and method for manufacturing same

US12340995B2 · kind B2 · utility

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8Claims
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Key dates

Filing dateJun 10, 2020
Grant dateJun 24, 2025
Priority date
Expiry dateOct 23, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/332
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A ruthenium-based sputtering target having a cast structure, in which a sputter surface of the sputtering target includes at least two or more types of regions, and crystal surfaces in the regions are different from each other, each of the crystal surfaces being specified by a main peak of X-ray diffraction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.