Patent · US Active

Trench MOSFET

US12342569B2 · kind B2 · utility

0Cited by
3References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 18, 2022
Grant dateJun 24, 2025
Priority date
Expiry dateJul 27, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/117

Abstract

The present disclosure relates to a trench metal-oxide-semiconductor field-effect transistor, trench MOSFET, and to a method for manufacturing such transistors. In particular, the present disclosure relates to trench MOSFETs having deep trenches adjacent to the more shallow gate defining trench for obtaining a RESURF effect. According to the present disclosure, an ion implantation region of a charge type similar to that of the drift region is formed in the drift region. The ion implantation region extends below the deep trenches of the trench MOSFET and is vertically aligned with a base of the deep trenches.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.