Multi-physical field measurement device for metal solidification process and housing thereof, and measurement method

US12345666B2 · kind B2 · utility

Assignee

• Shanghai Jiao Tong University · CN

Inventors

• Jiao Zhang · Naperville, US
• Yang Tang · Pleasanton, US
• YA-BEI ZHANG · Lo Wu, CN
• Yue Wu · Beijing, CN
• Hui XING · Nanhu, CN
• Baode Sun · Shanghai, CN
• Yanfeng Han · Shanghai, CN
• Yongbing Dai · Shanghai, CN
• Chaopeng FU · Shanghai, CN
• Qing Dong · Beijing, CN

Key dates

• Filing date: Jun 11, 2021
• Grant date: Jul 1, 2025
• Expiry date: Jan 30, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2005/063
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A multi-physical field measurement device for a metal solidification process and a housing and a measurement method thereof are provided. The device includes: a sealed housing provided with a light-through hole; a heater provided inside the housing and located behind the light-through hole along an X-ray; a diffraction detector used for receiving the X-ray which penetrates through a sample sheet and is scattered; a CMOS camera located behind the heater along the X-ray (11) and used for receiving a visible light signal which penetrates through the sample sheet; a silicon drift X-ray detector located at one side of the X-ray and used for receiving a fluorescent signal sent by interaction between the X-ray and the sample sheet; and an infrared thermal imager located at the other side of the X-ray and used for receiving an infrared signal sent by the sample sheet.