Patent · US Active

Alignment system and tool for visual inspection

US12346010B2 · kind B2 · utility

0Cited by
7References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 29, 2022
Grant dateJul 1, 2025
Priority date
Expiry dateMar 14, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70716
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An imaging device is provided that may be used for visually inspecting structures. In one embodiment, the imaging device includes an image capture device; and a rail system having a stationary component connected to the image capture device and a sliding component for movement along a horizontal axis. The system can further include a jig structure engaged to the sliding component of the rail system. The jig structure may include a first mount location for engagement to a first type connector and a second mount location for engagement to a second type connector. The jig structure is engaged to the sliding component to position the housing so that the first and second mount locations are in line and parallel to a direction of travel along the horizontal axis including a point at which the first and second mount locations pass through the imaging location.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.