Image analysis by prompting of machine-learned models using chain of thought
US12346828B2 · kind B2 · utility
Assignee
Inventors
- Jason Weng Wei
- Dengyong Zhou
- Dale Eric Schuurmans
- Quoc V. Le
- Maarten Bosma
- Ed H. Chi
- Olivier Jean Andre Bousquet
- Le Hou
- Nathan Kemp Sekiguchi Scales
- David J. Bieber
- Charles Aloysius Sutton
- Nathanael Martin Schärli
- Augustus Quadrozzi Odena
- Sharan Narang
- Guy Gur-Ari Krakover
- Aakanksha Chowdhery
- Aitor Lewkowycz
- Jiageng Luan
- David Martin Dohan
- Henryk Michalewski
- Jacob Austin
- Anders Johan Andreassen
- Maxwell Isaac Nye
- Xuezhi Wang
Key dates
| Filing date | Dec 3, 2024 |
| Grant date | Jul 1, 2025 |
| Priority date | — |
| Expiry date | Dec 3, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/042
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An example technique for image analysis is provided. An example image analysis method includes obtaining an instructive sequence descriptive of an instructive query, an instructive response, and an instructive trace of intermediate states from the instructive query to the instructive response. The example image analysis method includes inputting, to a machine-learned model, the instructive sequence and an operative image processing query that comprises image data, wherein the machine-learned model is configured to process the operative query with attention over the instructive sequence. The example method can include generating, using the machine-learned model and responsive to the operative query, an operative image processing response that comprises an analysis of the image data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.