Method and device for detecting defect, storage medium and electronic device
US12347085B2 · kind B2 · utility
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7References
19Claims
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Key dates
| Filing date | May 21, 2021 |
| Grant date | Jul 1, 2025 |
| Priority date | — |
| Expiry date | May 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20092
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided is a method and device for detecting defect, a computer readable storage medium and an electronic device, the method including: acquiring (S310) a detection task, and acquiring various types of images corresponding to the detection task; acquiring (S320) defect detection models trained by a same initial model corresponding to the types of the images respectively; and obtaining (S330) defect detection results by performing defect detection on respective type of images using the defect detection model corresponding to the type of the images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.