Apparatus, methods and computer programs for calibrating machine learning systems
US12347170B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2022 |
| Grant date | Jul 1, 2025 |
| Priority date | — |
| Expiry date | Mar 31, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Examples of the disclosure relate to apparatus, methods and computer programs for calibrating machine learning systems by using images captured by an imaging device. The apparatus can comprise means for: enabling at least one of a first device or second device to display one or more calibration images, the first device comprising an embedded machine learning system wherein the one or more calibration images are for calibrating the embedded machine learning system. The apparatus can also comprise means for controlling an imaging device to capture, at least part of, the one or more calibration images, wherein the imaging device is provided within the first device, and using the one or more calibration images captured by the imaging device to calibrate the embedded machine learning system of the first device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.