Patent · US Active

Detector circuit, signal processing circuit, and measurement instrument

US12352792B2 · kind B2 · utility

0Cited by

1References

17Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Wolfgang Wendler · Puchheim, DE
Gregor Feldhaus · Munich, DE
Florian Ramian · Munich, DE

Key dates

Filing date	Feb 15, 2023
Grant date	Jul 8, 2025
Priority date	—
Expiry date	Oct 19, 2043

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31907
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A detector circuit for a measurement instrument is described. The detector circuit includes a first signal input, a second signal input, and an averaging sub-circuit. The first signal input is configured to receive a first complex-valued measurement signal associated with an input signal received from a device under test. The second signal input is configured to receive a second complex-valued measurement signal associated with the input signal received from the device under test. The averaging sub-circuit is configured to determine an average of the first complex-valued measurement signal and of a complex conjugate of the second complex-valued measurement signal over a predetermined number of samples, thereby obtaining a complex-valued average signal. The averaging sub-circuit is configured to generate an output signal based on the complex-valued average signal. Further, a signal processing circuit and a measurement instrument are described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.