Artificial intelligence (AI)-based method for non-contact measurement of sheet resistance of a conductive film material
US12354007B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2025 |
| Grant date | Jul 8, 2025 |
| Priority date | — |
| Expiry date | Jan 17, 2045 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An artificial intelligence (AI)-based method for non-contact measurement of sheet resistance of a conductive film material, in which a non-contact measurement method commonly used in the field of electromagnetic wave absorbing-materials is adopted to measure reflection loss data of a wave-absorbing structure Salisbury screen composed of a film material and a substrate; a program-controlled AI model is adopted to predict reflection losses of Salisbury screens with different sheet resistances; the sheet resistance is continuously adjusted, and the range is gradually narrowed to fit the measured reflection loss data; and the sheet resistance of the conductive film materials is inversely deduced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.