Patent · US Active

Detection of structures

US12354251B2 · kind B2 · utility

0Cited by
7References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 21, 2022
Grant dateJul 8, 2025
Priority date
Expiry dateOct 14, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30108
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for detecting structures is provided. The method can include receiving inspection image data characterizing a region of interest of an object being inspected. The regions of interest can include one or more structures of the object. The method can also include determining, using a computer vision algorithm, a structure within the region of interest with respect to photometric properties of pixel data in the inspection image data. The structure can be determined using a predictive model trained to determine image filter parameter values for image filters of the computer vision algorithm based on applying optimization techniques using training image data and annotation data. An indication of the structure can be provided, for example for display or storage in memory. Systems and computer-readable mediums implementing the method are also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.