Defect detection
US12360013B2 · kind B2 · utility
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1References
31Claims
0Family size
Assignee
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Key dates
| Filing date | May 27, 2021 |
| Grant date | Jul 15, 2025 |
| Priority date | — |
| Expiry date | Jan 27, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M7/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of detecting defects in a mechanical system, the method includes the steps of:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.