Patent · US Active

Charged particle scanners

US12360265B2 · kind B2 · utility

0Cited by
18References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2022
Grant dateJul 15, 2025
Priority date
Expiry dateJan 26, 2044

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05H2277/1405
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.