Particle analysis system and particle analysis method
US12366518B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 16, 2021 |
| Grant date | Jul 22, 2025 |
| Priority date | — |
| Expiry date | Feb 16, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement spectrum obtained by irradiating a particle labeled with a plurality of fluorescent dyes with excitation light is separated for each fluorescent dye with high accuracy. Provided is a particle analysis system (1) including a plurality of photodetectors (23) configured to acquire light generated by irradiating a particle labeled with a plurality of fluorescent dyes with excitation light; and an information processing unit (132) configured to calculate fluorescence intensity of each fluorescent dye by performing separation processing on a measurement spectrum based on measured values from the plurality of photodetectors (23) with a single staining spectrum of each fluorescent dye, in which the separation processing is performed by using a weighted least squares method (WLSM) including a weight determined based on a variation in the measured values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.