Patent · US Active

Method and a system for analyzing a spectral signature of a compound specimen

US12366523B2 · kind B2 · utility

0Cited by
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11Claims
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Inventors

Key dates

Filing dateJul 14, 2021
Grant dateJul 22, 2025
Priority date
Expiry dateNov 7, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/3196
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for analyzing a spectral signature of a compound specimen is provided. The method includes illuminating a compound specimen with a light in a predetermined spectrum; obtaining a spectral signature of the compound specimen, the spectral signature including at least one light property of a plurality of wavelengths in the spectrum transmitted through the compound specimen; extracting characterizing features of the spectral signature, the characterizing features being light properties of predetermined wavelengths within the spectrum; and comparing the characterizing features with corresponding features stored in a database, the corresponding features are corresponding properties of an expected spectral signature of a specimen including an examined substance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.