Method and a system for analyzing a spectral signature of a compound specimen
US12366523B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jul 14, 2021 |
| Grant date | Jul 22, 2025 |
| Priority date | — |
| Expiry date | Nov 7, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3196
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing a spectral signature of a compound specimen is provided. The method includes illuminating a compound specimen with a light in a predetermined spectrum; obtaining a spectral signature of the compound specimen, the spectral signature including at least one light property of a plurality of wavelengths in the spectrum transmitted through the compound specimen; extracting characterizing features of the spectral signature, the characterizing features being light properties of predetermined wavelengths within the spectrum; and comparing the characterizing features with corresponding features stored in a database, the corresponding features are corresponding properties of an expected spectral signature of a specimen including an examined substance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.