Device and method for measuring correlation between fatigue performance and microstructure of one-dimensional (1D) nanomaterial in situ in transmission electron microscope (TEM)
US12366540B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2022 |
| Grant date | Jul 22, 2025 |
| Priority date | — |
| Expiry date | Apr 2, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2062
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a device and method for measuring a correlation between fatigue performance and a microstructure of a one-dimensional (1D) nanomaterial in situ in a transmission electron microscope (TEM), belongs to the technical field of in-situ testing and characterization of microstructures of nanomaterials. The device includes a chip part, a supporting part, and a control circuit. The supporting part is a bracket and a cable disposed on a transmission sample holder, and the circuit part consists of cables connected to the chip and a power supply capable of applying different waveforms, variable voltages, and variable frequencies. This design breaks through a traditional mechanical stress-driven fatigue performance test method, and achieves controllable adjustment of different amplitudes and cycles by using an electric field formed by a voltage and adjusting a voltage size and frequency, such that the 1D nanomaterial vibrates in the electric field to achieve fatigue performance testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.