Filter contamination measuring device, filter assembly including the same, and filter contamination measuring method using the same
US12366546B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2022 |
| Grant date | Jul 22, 2025 |
| Priority date | — |
| Expiry date | Nov 25, 2043 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC25B15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A filter contamination measuring device includes: a working electrode adjacent to a first surface of a filter, the filter configured to adsorb an ionic material of a first polarity, a counter electrode disposed on the other surface of the filter, a potentiostat configured to apply a voltage of a second polarity to the working electrode for a predetermined period of time, and to measure current output from the working electrode. The potentiostat is configured to increase the voltage over the predetermined amount of time. The filter contamination measuring device further includes a controller configured to calculate a maximum current attained during the predetermined amount of time and a corresponding voltage value, and to determine the type and concentration of the ionic material based on the maximum current and the voltage value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.