Patent · US Active

Fault detection circuit

US12366607B2 · kind B2 · utility

0Cited by
7References
26Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 28, 2023
Grant dateJul 22, 2025
Priority date—
Expiry dateSep 28, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31932
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Fault detection circuits and methods. An example of a fault detection circuit includes a comparator configured to compare a voltage at a voltage terminal with a reference voltage, a digital logic circuit coupled to a test terminal and configured to receive, responsive to the voltage at the voltage terminal being less than the reference voltage as indicated by the comparator, a test signal, the digital logic circuit including at least one digital logic gate, and an edge detection circuit configured to (a) monitor a signal produced at an output of the at least one digital logic gate, and (b) based on the signal failing to transgress a threshold within a time period, providing a fault signal indicating detection of a fault at the test terminal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.