Intensity extraction for feature values in base calling
US12367263B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2024 |
| Grant date | Jul 22, 2025 |
| Priority date | — |
| Expiry date | Mar 13, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The technology disclosed extracts intensities from sequencing images for base calling target clusters and attenuates spatial crosstalk from neighboring clusters. The technology disclosed accesses a particular section from a plurality of sections of an image output by a sensor, the particular section of the image including at least one pixel depicting intensity emission values from a target cluster and neighboring clusters located across the sensor, and convolves the particular section of the image with a corresponding convolution kernel in a plurality of convolution kernels, to generate a feature map comprising a plurality of feature values. The technology disclosed further assigns a corresponding feature value to the target cluster based on feature values in the plurality of feature values adjoining a center of the target cluster, and processes the corresponding feature value assigned to the target cluster, to base call the target cluster.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.