Machine-vision system and method for remote quality inspection of a product
US12368824B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 19, 2023 |
| Grant date | Jul 22, 2025 |
| Priority date | — |
| Expiry date | Jul 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.