Method for controlling a semiconductor-laser-diode-based SS-interferometer system

US12372462B2 · kind B2 · utility

Assignee

• Carl Zeiss Meditec AG · DE

Inventors

• Rainer Leitgeb · Wien, AT
• Manfred Dick · Gefell, DE
• Roland Bergner · Jena, DE
• Ralf Ebersbach · Schmölln, DE
• Thomas Pabst · Leonberg, DE

Key dates

• Filing date: Feb 28, 2020
• Grant date: Jul 29, 2025
• Expiry date: Jan 8, 2042

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01S5/34326
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method of controlling a semiconductor-laser-diode-based SS-interferometer system (SS=swept source), for a wide range of application suitable for use in ophthalmology, for example for imaging and for determining biometric measurement values of the eye. In a method according to the invention, by application of periodic current modulation, the operation of single semiconductor laser diode is designed such that a highly coherent spectral laser line can be adjusted with a highest possible repetition rate over a wide wavelength range. The parameters: center wavelength, sweep rate, sweep range, optical power in the eye and coherence length are adjusted such that the method is suitable for imaging and biometric applications via whole-eye scans. A semiconductor-laser-diode-based SS-interferometer system is provided, for biometric measuring of the eye. Embodiments are based for example on optical, coherence tomographic scan images. Applications lie in ophthalmological diagnostics, treatment and the preparation of surgical procedures and follow-up thereof.