Voltage probe device with adjustable bias
US12372551B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 24, 2022 |
| Grant date | Jul 29, 2025 |
| Priority date | — |
| Expiry date | May 21, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for compensating for thermal drift of a probe device includes monitoring a first temperature of a laser source in a sensor head that receives output electrical signals from a DUT and outputs corresponding optical signals; monitoring a second temperature of a photoreceiver in a probe interface that converts the optical signals to electrical test signals to input to the test instrument; calculating a first value of a first bias voltage; applying the first value of the first bias voltage to the laser source to compensate for thermal drift when the first temperature is within a first predefined temperature range; calculating a second value of a second bias voltage for the photoreceiver; and applying the second value of the second bias voltage to the photoreceiver to compensate for thermal drift when the second temperature is within a second predefined temperature range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.