Method for statistically correcting the estimation of the state of a system and device therefor
US12372664B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 16, 2023 |
| Grant date | Jul 29, 2025 |
| Priority date | — |
| Expiry date | Feb 4, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S19/47
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for statistically correcting the estimation of the state X of a system, the state X including a physical quantity, correcting the estimation of this state X being carried out on the basis of a plurality of observations Yi relating to this state X, each observation being obtained by a different measurement relating to at least one physical quantity, the method being implemented by a device including a calculator, the method including determining for each observation Yi, the difference between the observation Yi and the estimated state referred to as innovation Zi, using the relationship Zi=Yi−HX where H is the observation matrix associated with the statistical filter considered; associating an ordering parameter with each observation Yi, the ordering parameter being given by the relationship Ordi=|Zref−Zi| where Zref is a predetermined reference value; classifying the measurements in ascending order of the ordering parameter associated therewith; and correcting errors on the estimations using the statistical filter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.