Spectrum emission mask verification based on EIRP measurement
US12375195B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2023 |
| Grant date | Jul 29, 2025 |
| Priority date | — |
| Expiry date | Feb 7, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/23
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A testing device determines an Effective Isotropic Radiated Power (EIRP) of a wanted signal at a beam-peak direction and a maximum Total Radiated Power (TRP) of the wanted signal. The testing device then determines a power difference (ΔP) between the EIRP of the wanted signal at the beam-peak direction and the maximum TRP of the wanted signal. The testing device determines EIRP of a spectral emission mask (SEM) at each measurement bandwidth step at the beam-peak direction. The testing device then determines TRP at each measurement bandwidth step by determining a difference between the EIRP of the SEM at that measurement bandwidth step and the power difference (ΔP). The testing device compares the TRP at each measurement bandwidth step to a SEM specification, and reports whether the SEM specification has been met.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.