Process for fabricating a semiconductor diode via wet and dry etches
US12376423B2 · kind B2 · utility
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8Claims
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Key dates
| Filing date | Sep 13, 2022 |
| Grant date | Jul 29, 2025 |
| Priority date | — |
| Expiry date | Nov 1, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S2301/176
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The invention relates to a process for fabricating a semiconductor diode (1) via transfer of a semiconductor stack (20) then local etching to form a semiconductor pad (30), the production of the semiconductor pad (30) comprising a plurality of sequences comprising a dry etch that leaves a residual segment (23.1; 22.1), formation of a hard-mask spacer (42.1; 43.1), then a wet etch of the residual segment (23.1; 22.1).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.