Particle analyzer, particle analysis method, and optical measurement device
US12379304B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 2021 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Apr 18, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1493
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle analyzer (100) includes: a light source that emits excitation light (EL1) including light having a wavelength of 400 nm or less; a lens structure (41) that collects excitation light (EL1) at a predetermined position (51s) in a flow path (53); a detection unit (7) that detects light (FL) emitted from a particle as the particle (51) flowing through the predetermined position is excited by the excitation light (EL1); and a processing unit (120) that processes detection data acquired by the detection unit (7). The lens structure (41) includes a plurality of lenses (411) arranged along an optical axis of the excitation light (EL1); and a lens frame (412) holding the plurality of lenses (411). At least one (G12) of the plurality of lenses (411) is positioned in the lens frame (412) by abutting on a lens adjacent to the lens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.