Systems and methods for imaging and characterizing objects including the eye using non-uniform or speckle illumination patterns
US12379312B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 30, 2020 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Jun 2, 2042 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/0066
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are provided for imaging and characterizing objects including the eye using non-uniform or speckle illumination patterns. According to the present technology, a method for characterizing at least a portion of an object may include generating, using at least one light source, one or multiple non-uniform illumination patterns on an object. The method may also include detecting, using a detector, backscattered light from the object in response to the generating. The method may further include extracting, using the detector, data representative of the backscattered light. The method may also include processing, using a processing unit, the data representative of the backscattered light to create one or more images of at least a portion of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.