Method and apparatus for measuring surface gloss and spectral reflectance
US12379314B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 13, 2022 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Jun 3, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/127
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes controlling a gloss channel of a color measurement apparatus to measure a surface gloss of a color sample to generate a gloss value for the color sample. A color channel of the color measurement apparatus is controlled to measure a reflectance spectrum of the color sample to generate a first plurality of reflectance values for the color sample under a first measurement geometry. The first plurality of reflectance values are converted to a second plurality of reflectance values representing the reflectance spectrum of the color sample under a second measurement geometry, different from the first measurement geometry. The converting utilizes an adjustment that is a function of the gloss value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.