Systems and methods for image processing
US12380556B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 28, 2022 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Sep 22, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/03
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method may include obtaining an image of an object; obtaining a target artifact identification model; determining target artifact feature information by inputting the image into the target artifact identification model, the target artifact feature information indicating a feature of one or more artifacts in the image; obtaining a target artifact extent determination model; determining target artifact extent indication information by inputting the image and the target artifact feature information into the target artifact extent determination model, the target artifact extent indication information indicating an influence extent of the one or more artifacts on an image quality of the image; in response to determining that the influence extent is greater than or equal to the extent threshold, outputting a notice of the one or more artifacts of the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.