Image analysis for scanning optical patterns in a real scene at dynamic ranges
US12380571B1 · kind B1 · utility
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20Claims
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Key dates
| Filing date | Dec 8, 2022 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Jun 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
To decode an optical pattern in a real scene, an optical pattern is detected in one or more images acquired by a camera, a distance from the optical pattern to the camera is estimated, the distance from the optical pattern to the camera is compared to a threshold value, acquiring an image of the optical pattern, down sampling the image, based on the distance from the optical pattern to the camera being less than the threshold value, to generate a down-sampled image, and the optical pattern is decoded in the down-sampled image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.