Optical axis calibration method and apparatus of optical axis detection system, terminal, system, and medium
US12380602B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 3, 2023 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Feb 1, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30204
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for calibrating an optical axis includes: acquiring a first speckle image and a second speckle image captured respectively before and after a speckle emission device is rotated; extracting at least two first speckle points in the first speckle image and second speckle points in the second speckle image corresponding to the at least two first speckle points, to obtain at least two line segments formed by lines connecting the first speckle points and the second speckle points corresponding to the first speckle points in the same image coordinate system; and calculating a perpendicular bisector of each of the line segments, and determining an optical axis reference point according to an intersection point of the perpendicular bisectors. The method provided in embodiments of this application can reduce the impact of a jig tolerance on the optical axis calibration, and improve the accuracy of the optical axis calibration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.