Patent · US Active

Operating modes for testing monitor circuits

US12381408B2 · kind B2 · utility

0Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 14, 2022
Grant dateAug 5, 2025
Priority date
Expiry dateJun 3, 2044

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH02J2310/48
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A system is provided. In some examples, the system includes a control circuit and a plurality of monitor circuits including a first monitor circuit. In a production mode, the control circuit is configured to test the plurality of monitor circuits. In a storage mode after testing the plurality of monitor circuits in the production mode, the control circuit is configured to test the plurality of monitor circuits more than once. In an assembly mode after testing the plurality of monitor circuits in the storage mode, the control circuit is configured to test the plurality of monitor circuits. In one or more examples, the control circuit is configured to skip the storage mode and test the plurality of monitor circuits in the assembly mode after testing in the production mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.