Thin-film LiTaO3 SAW resonator on silicon substrate with reduced spurious modes
US12381531B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2020 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Nov 26, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03H9/725
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A SAW resonator with reduced spurious modes is provided. The resonator comprises a (111) silicon carrier substrate (CS), an electrode structure (ES) and a piezoelectric layer (PIL). The carrier substrate has a crystal orientation with the Euler angles (−45°±10°; −54°±10°; 60°±30°) and the piezoelectric layer comprises LiTaO3 and has a crystal orientation with the Euler angles (0°; 56°±8°; 0°). There may be intermediate layers (IL1, IL2) of SiO2 and amorphous or polycrystalline materials. In addition a silicon nitride layer is provided as passivation (PAL). Electrodes are made of aluminum. Thicknesses of all layers are selected in particular ranges to optimize SAW behaviour.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.