Patent · US Active

Thin-film LiTaO3 SAW resonator on silicon substrate with reduced spurious modes

US12381531B2 · kind B2 · utility

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Key dates

Filing dateJun 25, 2020
Grant dateAug 5, 2025
Priority date
Expiry dateNov 26, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03H9/725
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A SAW resonator with reduced spurious modes is provided. The resonator comprises a (111) silicon carrier substrate (CS), an electrode structure (ES) and a piezoelectric layer (PIL). The carrier substrate has a crystal orientation with the Euler angles (−45°±10°; −54°±10°; 60°±30°) and the piezoelectric layer comprises LiTaO3 and has a crystal orientation with the Euler angles (0°; 56°±8°; 0°). There may be intermediate layers (IL1, IL2) of SiO2 and amorphous or polycrystalline materials. In addition a silicon nitride layer is provided as passivation (PAL). Electrodes are made of aluminum. Thicknesses of all layers are selected in particular ranges to optimize SAW behaviour.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.