Method of analyzing a spectral peak
US12385780B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 12, 2022 |
| Grant date | Aug 12, 2025 |
| Priority date | — |
| Expiry date | Aug 7, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2883
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, devices, and methods of analyzing an interfered peak of a sample spectrum is disclosed. The sample spectrum may be generated using a detector of an optical spectrometer. The interfered peak may be produced by a plurality of spectral peaks of different wavelengths. The method may include generating interfered curve parameters representative of the peak shape of each spectral emission in the interfered peak based at least in part on a model of expected curve parameters for the optical spectrometer and a location of the interfered peak on the detector of the optical spectrometer; fitting a plurality of curves to the interfered peak, each curve corresponding to one of the plurality of spectral emissions of different wavelengths forming the interfered peak, wherein each curve is fitted using the interfered curve parameters provided by the model of expected peak parameters; and outputting the plurality of curves for further analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.