Method of manufacturing reference sample, method of measuring droplet, and apparatus for measuring droplet
US12385812B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Jun 16, 2022 |
| Grant date | Aug 12, 2025 |
| Priority date | — |
| Expiry date | Jun 2, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30241
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of manufacturing a reference sample includes discharging a droplet, obtaining a plurality of captured images by capturing the droplet according to a predetermined period with respect to an imaginary plane defined on a falling path of a discharged droplet, analyzing the plurality of captured images, and marking a point corresponding to the falling path of the droplet on a sample substrate based on a result of analyzing the plurality of captured images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.