Electron microscopy grids and high-resolution structural determination methods
US12385813B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 20, 2021 |
| Grant date | Aug 12, 2025 |
| Priority date | — |
| Expiry date | Sep 21, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides in an electron microscopy grid, comprising: a perforated substrate; a support film on the perforated substrate; a mixture of different linker molecules according to Structure (I), wherein AG is an anchoring group, for anchoring the linker molecule to the solid support; BU is a binding unit, for binding to the analyte; L1 is a first linear linker section; L2 is a second linear linker section; α is the angle between the linear linker section L1 and the linear linker section L2; AS is an angled linker section, connecting the linear linker section L1 and the linear linker section L2. The invention further provides in method of structural determination of analytes, using such EM-grids.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.