Temperature compensation system and method for NIR sample on baler
US12385830B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 2020 |
| Grant date | Aug 12, 2025 |
| Priority date | — |
| Expiry date | Sep 22, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8466
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A baler includes a near-infrared testing system configured to receive near-infrared radiation reflected by plant material in a bale and to analyze the near-infrared radiation and generate evaluation data reflecting one or more properties of the plant material. The near-infrared testing system is calibrated using a calibration sample at a calibration temperature. A temperature sensor measures a sample temperature of a crop sample of the plant material. A computer receives and combines the evaluation data of the plant material and a temperature-difference offset based on the difference in the sample temperature of the crop sample and the calibration temperature to produce overall temperature-compensated evaluation data reflecting one or more overall property values for the bale, and assign the overall temperature-compensated evaluation data to the at least one bale of the plurality of bales.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.