Patent · US Active

Systems and methods for characterizing atmospheric emissions

US12385834B2 · kind B2 · utility

0Cited by
1References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2021
Grant dateAug 12, 2025
Priority date
Expiry dateMay 11, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01W2201/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for characterizing gas emissions includes sampling each of a plurality of sectors having a common geographic center. For each sector, a first laser beam is transmitted from the geographic center to a first retroreflection location, where it is retroreflected into a first retroreflected beam. Near the geographic center, the first retroreflected beam is measured to obtain a first absorption. A second laser beam is then transmitted from the geographic center to a second retroreflection location, where it is retroreflected into a second retroreflected beam. Near the geographic center, the second retroreflected beam is measured to obtain a second absorption. The first and second retroreflection locations are both located within the same sector. First and second concentrations are determined from the first and second absorptions and processed to determine emission information about a known or potential gas source whose source lies within the sector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.