Defect detection method and device based on nonlinear system identification
US12392699B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 9, 2025 |
| Grant date | Aug 19, 2025 |
| Priority date | — |
| Expiry date | May 9, 2045 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0641
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A defect detection method and device based on nonlinear system identification are provided. The defect detection method includes: performing, by a modal force hammer, hammer excitation on a test specimen according to a test schedule to generate an excitation signal and a response signal; acquiring, by a laser vibrometer, the excitation signal and the response signal; performing parameter calculation on the excitation signal and the response signal to obtain model parameters; constructing an initial Hammerstein model based on the model parameters; optimizing the initial Hammerstein model to obtain a Hammerstein model of the test specimen; adjusting the Hammerstein model of the test specimen by using a cross-validation method; perform defect determination based on the Hammerstein model of the test specimen adjusted and a pre-constructed template specimen model to obtain a determination result, and determining whether the test specimen is defective based on the determination result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.