High-temporal-accuracy electromagnetic fault injection method and apparatus for cryptographic chip
US12393699B1 · kind B1 · utility
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Key dates
| Filing date | Dec 30, 2024 |
| Grant date | Aug 19, 2025 |
| Priority date | — |
| Expiry date | Dec 30, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2221/034
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Disclosed in the present application are a high-temporal-accuracy electromagnetic fault injection method and apparatus for a cryptographic chip. The method includes: adjusting fault injection time jointly according to peak time and rise time of an electromagnetic pulse signal, thereby enhancing the accuracy of controlling injection time, improving the analysis efficiency and effect of differential fault analysis, and increasing the success rate of the effective fault injection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.