Time series analysis using a shapelet learning method with area under the curve
US12393882B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2020 |
| Grant date | Aug 19, 2025 |
| Priority date | — |
| Expiry date | Mar 17, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A time series data analysis method, includes: generating a plurality of first feature vectors including feature amounts of a plurality of feature waveforms, based on distances from a plurality of first time series data sequences to the plurality of feature waveforms, the first time series data sequences belonging to a first class; generating a plurality of second feature vectors including feature amounts of the plurality of feature waveforms, based on distances from a plurality of second time series data sequences to the plurality of feature waveforms, the plurality of second time series data sequences belonging to a second class; and updating the plurality of feature waveforms, based on the plurality of first feature vectors, the plurality of second feature vectors, a performance indicator parameter related to a performance indicator for a classification model and a model parameter including weights on the plurality of feature waveforms.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.