Method and systems for on-demand image intensity correction
US12395756B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 30, 2023 |
| Grant date | Aug 19, 2025 |
| Priority date | — |
| Expiry date | Jan 18, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems are provided for correcting intensity variation in a raw image acquired via a microscopy imaging system. In one example, a method includes acquiring a reference image and developing an intensity model based on the reference image wherein the intensity model comprises a pre-determined number of a plurality of model parameters obtained via curve fitting a single analytical function or a linear combination of a plurality of analytical functions, embedding model parameters of the intensity model of the reference image into the raw image for image processing at a later time; and correcting the raw image based on the intensity model of the reference image on-demand. As another example, a method includes utilizing the plurality of parameters of the intensity model as a hardware signature to indicate whether a plurality of optical system parameters is maintained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.