Method for measuring surface parameter of copper foil, and method for sorting copper foil
US12399001B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 2022 |
| Grant date | Aug 26, 2025 |
| Priority date | — |
| Expiry date | Dec 14, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement method capable of acquiring, in a simple manner, a surface parameter of copper foil exhibiting high correlation with high frequency characteristics, the method including: (a) acquiring a surface profile of surface-treated copper foil as a reference; (b) setting a cutoff value for an L filter, the cutoff value satisfies: (i) an arithmetical mean height Sa after processing with the L filter, being 0.5 μm or less, and (ii) a percent change of Sdr or α value after processing with the L filter being 80% or less; (c) acquiring a surface profile of surface-treated copper foil as a measurement object; (d) subjecting the acquired surface profile of the copper foil as the measurement object to filter processing; and (e) calculating at least one of surface parameters defined in ISO25178 on the copper foil as the measurement object based on the surface profile after the filter processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.