Spectroscopic analysis system and spectroscopic analysis method
US12399063B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 28, 2023 |
| Grant date | Aug 26, 2025 |
| Priority date | — |
| Expiry date | Jul 30, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/4406
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectroscopic analysis system includes: an operation panel configured to receive an input of at least one of an upper limit value of a measurement period of a spectroscopic analysis spectrum or a lower limit value of measurement accuracy as a user setting condition related to measurement of the spectroscopic analysis spectrum of a sample; and a control unit configured to derive a predetermined recommended measurement condition that satisfies the user setting condition and cause a display unit to display the recommended measurement condition, in which the recommended measurement condition is at least one of a wavelength range of light to be used for measurement of the spectroscopic analysis spectrum, a sampling interval of a wavelength of the light, a slit width of a diffraction grating of a spectroscope that disperses the light, or a sweep speed of the wavelength of the light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.