Temperature-compensated dielectric-constant measuring device

US12399143B2 · kind B2 · utility

Assignee

• Endress+Hauser SE+Co. KG · DE

Inventors

• Pablo Ottersbach · Essen, DE
• Thomas Blödt · Basel, CH

Key dates

• Filing date: Jul 22, 2021
• Grant date: Aug 26, 2025
• Expiry date: Mar 15, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N22/00
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A high-frequency-based measuring device for determining a temperature-compensated dielectric constant of a medium includes a measuring probe having an electrically conductive inner conductor and an outer conductor. The inner conductor is rod-like along an axis. The inner wall of the outer conductor is symmetrical about the axis of the inner conductor and expands along the axis toward the medium. The measuring device includes a temperature sensor located in a first end region of the inner conductor, toward which end region the inner wall of the outer conductor expands. One of the temperature sensor terminals is at the potential of the inner conductor. The temperature of the medium is measured directly, without impairment of the high-frequency-based measurement of the dielectric constant. A highly accurate measurement of the dielectric constant and highly accurate temperature compensation are thereby made possible.