Patent · US Active

Modular test system

US12399796B2 · kind B2 · utility

0Cited by

0References

20Claims

0Family size

Assignee

Dell Products L.P. · US

Inventors

Matthew Borsini · Northborough, US
Leland W. Thompson · Tustin, US
Michael Rijo · San Jose, US
Samuel Hudson · Foxborough, US
Robert Proulx · Holden, US

Key dates

Filing date	Apr 26, 2022
Grant date	Aug 26, 2025
Priority date	—
Expiry date	Jan 28, 2044

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3058
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A modular test system includes a modular controller subsystem coupled to a modular tested subsystem by a modular intermediary subsystem. The modular intermediary subsystem transmits communications between the modular controller subsystem and the modular tested subsystem during testing operations performed by the modular controller subsystem, and performs at least one testing function that is not available in the modular controller subsystem during the testing operations performed by the modular controller subsystem.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.