Test cycle time reduction and optimization
US12399806B2 · kind B2 · utility
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5References
20Claims
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Key dates
| Filing date | Jul 9, 2021 |
| Grant date | Aug 26, 2025 |
| Priority date | — |
| Expiry date | Feb 22, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3668
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system that automatically reduces test cycle time to save resources and developer time. The present system selects a subset of tests from a full test plan that should be selected for a particular test cycle, rather than running the entire test plan. The subset of tests is intelligently selected using metrics such as tests associated with changed code and new and modified tests.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.