Image analysis method and device
US12400752B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2019 |
| Grant date | Aug 26, 2025 |
| Priority date | — |
| Expiry date | Dec 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30061
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An image analysis method and device is for detecting failure or error in an image segmentation procedure. The method comprises comparing (14) segmentation outcomes for two or more images, representative of a particular anatomical region at different respective time points, and identifying a degree of consistency or deviation between them. Based on this derived consistency or deviation measure, a measure of accuracy of the segmentation procedure is determined (16).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.